1. Milić M. Pejović, „Physico-chemical processes in vertical-double-diffused metal-oxide-semiconductor field effect transistors induced by gamma-ray irradiation and post-irradiation annealing“, Facta Universitatis, series: Physics, Chemistry and Technology, Vol. 13, No. 1, pp. 13-27, 2015, DOI: 10.2298/FUCT1501013p, UDC621.039:541.15.
2. Milić M. Pejović, “P-channel MOSFET as a sensor and dosimeter of ionizing radiation”, Facta Universitatis, Series: Electronics and Energetics, Vol. 29, No. 4, pp. 509-541, 2016 (pregledni rad), DOI:10.2298/FUEE 1604509P.
Miloš Djordjević, Vesna Paunović, Danijel Danković, Milić Pejović, A Method for Automating the Measurement and Characterization of Electrical Materials, 14th International conference on advanced technologies systems and services in telecommunications, TELSIKS 2019, October 23-25, pp. 219-222, Nis, 2019.