1. S. Golubović, S. Đorić-Veljković, I. Manić, V. Davidović, "Efekti naprezanja oksida gejta VDMOS tranzistora snage", Monografija, Elektronski fakultet Niš, Edicija monografije (2006).ISBN: 86-85195-16-0 (М41)
2. D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, and N. Stojadinović, "Implications of Negative BiasTemperature Instability in Power MOS Transistors " in Micro Electronic and Mechanical Systems, ISBN 978-953-307-027-8, edited by Kenichi Takahata, IN-TECH Press, Boca Raton, pp. 19.319-19.342 (2009) (M13)
3. N. Stojadinović, I. Manić, D. Danković, S. Djorić-Veljković, V.Davidović, A. Prijić, S. Golubović, Z. Prijić", Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors" in Bias Temperature Instability for Devices and Circuits, edited by Tibor Grasser, IN-TECH Press, Boca Raton, pp. 533-559 (2014) ISBN: 978-1-4614-7908-6 (Print) 978-1-4614-7909-3 (e-book) DOI: 10.1007/978-1-4614-7909-3 (М13)
1. S. Đorić-Veljković, J. Karamarković, "Praktikum iz fizike", Univerzitet u Nišu, Građevinsko-arhitektonski fakultet, 2011. ISBN: 978-86-80295-95-4
2. Dragan Aranđelović, Snežana Đorić-Veljković, "Simulation in Vadose Zone Environment - Simulacija u nezasićenim sredinama", Austrian Development Cooperation, Wus Austria - Master Studies Development Program - MSDP, Univerzitet u Nišu, Građevinsko-arhitektonski fakultet Niš, 2011.
3. Snežana Đorić-Veljković, Momčilo Kocić, Marija Stojanović-Krasić, "Fizika - elektricitet, optika, atomska i nuklearna fizika", Univerzitet u Nišu, Tehnološki fakultet, 2015. ISBN: 978-86-89429-09-1
1. N. Stojadinović, S. Djorić, S. Golubović and V. Davidović, "Separation of Irradiation Induced Gate Oxide Charge and Interface Traps Effects in Power VDMOSFETs", Electronics Letters, vol. 30, pp. 1992-1993 (1994)
2. N. Stojadinović, S. Golubović, S. Djorić and S. Dimitrijev, "Analysis of Gamma-Irradiation Induced Degradation Mechanisms in Power VDMOSFETs" , Microelectronics and Reliability, vol. 35, pp. 587-602 (1995)
3. N. Stojadinović, S. Golubović, V. Davidović, S. Djorić-Veljković and S. Dimitrijev, "Modeling Radiation-Induced Mobility Degradation in MOSFETs", Phys. Stat. Sol. (a), vol. 169, pp. 63-66 (1998)
4. S. Golubović, S. Djorić-Veljković, V. Davidović, and N. Stojadinović, "Modeling of -irradiation and lowered temperature effects in power VDMOS transistors”, Japanese J. Appl. Phys, vol. 38, pp. 4699-4702 (1999), N. Stojadinović, S. Golubović, S. Djorić-Veljković, and V. Davidović, "Correction to "Modeling of -irradiation and lowered temperature effects in power VDMOS transistors"", Japanese J. Appl. Phys, vol. 40 (3A), p. 1530 (2001)
5. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović and S. Dimitrijev, “Mechanisms of Positive Gate Bias Stress Induced Instabilities in Power VDMOSFETs", Microelectronics Reliability, vol. 41, pp. 1373-1378 (2001)
6. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović and S. Golubović, "Radiation hardening of power VDMOSFETs using electrical stress", Electronics Letters, vol. 38, pp. 431-431 (2002)
7. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović and S. Dimitrijev, “Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs”, Microelectronics Reliability, vol. 42, pp. 669-677 (2002)
8. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović, and S. Golubović, “Effects of burn-in stressing on radiation response of power VDMOSFETs”, Microelectronics Journal, vol. 33, pp. 899-905 (2002)
9. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović and S. Dimitrijev, “Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs”, Microelectronics Reliability, vol. 42, pp. 1465-1468 (2002)
10. S. Djorić-Veljković, I. Manić, V. Davidović, S. Golubović and N. Stojadinović, “Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs”, Microelectronics Reliability, vol. 43, pp. 1455-1460 (2003)
11. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović and S. Dimitrijev, "Effects of Electrical Stressing in Power VDMOSFETs", Microelectronics Reliability, vol. 45, pp. 115-122 – invited paper (2005)
12. N. Stojadinović, D. Danković, S. Djorić-Veljković, V. Davidović, I. Manić, S. Golubović, “Negative bias temperature instability mechanisms in p-channel power VDMOSFETs”, Microelectronics Reliability, vol. 45, pp. 1343-1348 (2005)
13. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović and S. Dimitrijev, “Electrical stressing effects in commercial power VDMOSFETs”, IEE Proc.- Circuits, Devices and Systems, vol. 153, pp. 281-288 (2006)
14. D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, N. Stojadinović, "NBT Stress-Induced Degradation and Lifetime Estimation in p-channel Power VDMOSFETs", Microelectronics Reliability, vol. 46 , pp. 1828 - 1833 (2006)
15. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, N. Stojadinović, "Negative Bias Temperature Instabilities in Sequentialy Stressed and Annealed in p-Channel Power VDMOSFETs", Microelectronics Reliability, vol. 47, pp. 1400 - 1405 (2007)
16. I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, "Mechanisms of Spontaneous Recovery in DC Gate Bias Stressed Power VDMOSFETs", IEE Proc. - Circuits, Devices and Systems, vol. 2, pp. 213-221 (2008)
17. V. Davidović, N. Stojadinović, D. Danković, S. Golubović, I. Manić, S. Djorić-Veljković, and S. Dimitrijev, "Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors", Japanese J. Appl. Phys, vol. 47, pp. 6272-6276 (2000)
18. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, and N. Stojadinović, "Negative Bias Temperature Instability in n-Channel Power VDMOSFETs", Microelectronics Reliability, vol. 48, pp. 1313 - 1317 (2008)
19. I. Manić, D. Danković, S. Djorić-Veljković, V. Davidović, S. Golubović, and N. Stojadinović, "Effects of Low Gate Bias Annealing in NBT Stressed p-Channel Power VDMOSFETs", Microelectronics Reliability, vol. 49, pp. 1003 - 1007 (2009)
20. N. Stojadinović, D. Danković, I. Manić, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, "Threshold Voltage Instabilities in p-Channel Power VDMOSFETs Under Pulsed NBT Stress", Microelectronics Reliability, vol. 50, pp. 1278-1282 (2010)
21. S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, and N. Stojadinović, "Annealing of Radiation-Induced Defects in Burn-in Stressed Power VDMOSFETs", Nuclear Technology & Radiation Protection, vol. 26, no. 1, pp. 18-24 (2011)
22. I. Manić, D. Danković, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, and N. Stojadinović, "NBTI Related Degradation and Lifetime Estimation in p-Channel Power VDMOSFETs Under the Static and Pulsed NBT Stress Conditions", Microelectronics Reliability, vol. 51, no. 9-11, pp. 1540 - 1543 (2011) ISSN 0026-2714, DOI: 10.1016/j.microrel.2011.06.004 (M22)
23. D. Danković, I. Manić, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, and N. Stojadinović, "Effects of Static And Pulsed Negative Bias Temperature Stressing on Lifetime in p-Channel Power VDMOSFETs", Informacije MIDEM-Journal of Microelectronics Electronic Components and Materials, vol. 43, iss. 1, pp. 58-66 (2013) ISSN: 0352-9045 Accession Number: WOS:000318180100008 (M23)
24. S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, and N. Stojadinović, "Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power VDMOSFETs", Nuclear Technology & Radiation Protection, vol. 28, no. 4, pp. 406-414 (2013) ISSN: 1451-3994 DOI: 10.2298/NTRP1304406D (M22)
25. A. Jovanović, P. Pejić, S. Djorić-Veljković, J. Karamarković, M. Djelić, "Importance of building orientation in determining daylighting qualityin student dorm rooms: Physical and simulated daylighting parameters’ values compared to subjective survey results", Energy and Buildings, vol. 77, pp. 158-170 (2014) ISSN: 0378-7788 DOI: 10.1016/j.enbuild.2014.03.048 (M21a)
26. S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, and N. Stojadinović, "Annealing Influence on Recovery of Electrically Stressed Power Vertical Double-Diffused Metal Oxide Semiconductor Transistors", Japanese Journal of Applied Physics, vol. 54, no. 6, pp. 064101-1-7 (2015) ISSN: 0021-4922 DOI: 10.7567/JJAP.54.064101 (M23)
27. D. Danković, I. Manić, A. Prijić, S. Djorić-Veljković, V. Davidović, N. Stojadinović, Z. Prijić, S. Golubović, "Negative Bias Temperature Instability in P-Channel Power VDMOSFETs: Recoverable Versus Permanent Degradation", Semiconductor Science and Technology, vol. 30, pp.105009-1-9 (2015) ISSN: 0268-1242 DOI: 10.1088/0268-1242/30/10/105009 (M22)
28. D. Danković, N. Stojadinović, Z. Prijić, I. Manić, V. Davidović, A. Prijić, S. Djorić-Veljković, S. Golubović, "Analysis of Recoverable and Permanent Components of Threshold Voltage Shift in NBT Stressed P-Channel Power VDMOSFET", Chinese Physics B, vol. 24, no. 10, pp. 106601-1-9 (2015) ISSN: 1674-1056 DOI: 10.1088/1674-1056/24/10/106601 (M22)
29. V. Davidović, D. Danković, A. Ilić, I. Manić, S. Golubović, S. Djorić-Veljković, Z. Prijić, N. Stojadinović, "NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors", IEEE Transactions on Nuclear Science, vol. 63, no. 2, pp. 1268-1275 (2016) ISSN: 0018-9499, DOI: 10.1109/TNS.2016.2533866 (M21)
30. Marija Stojanović Krasić, Ana Mančić, Slavica Kuzmanović, Snežana Đorić Veljković, Milutin Stepić, "Linear and interface defects in composite linear photonic lattice", Optics Communications, vol. 394, no. 1, pp. 6-13 (2017) ISSN: 0030-4018, DOI: 10.1016/j.optcom.2017.02.021 (M23)
31. Sofija M. Rančić, Snežana D. Nikolić-Mandić, Aleksandar Lj. Bojić, Snežana M. Đorić-Veljković, Aleksandra R. Zarubica, Predrag Lj. Janković, "Application of the reaction system methylene blue B-(NH4)(2)S2O8 for the kinetic spectrophotometric determination of palladium in citric buffer media", Hemijska industrija, vol. 71, iss.:2, pp.97-104 (2017) ISSN: 0367-598X DOI:10.2298/HEMIND140821080R (M23)
32. D. Danković, I. Manić, A. Prijić, V. Davidović, Z. Prijić, S. Golubović, S. Djorić-Veljković, A. Paskaleva, D. Spassov, N. Stojadinović, "A review of pulsed NBTI in P-channel power VDMOSFETs", Microelectronics Reliability, vol. 82, March, pp. 28 - 36 (2018) (review paper) ISSN: 0026-2714 DOI: 10.1016/j.microrel.2018.01.003 (M22)
33. V. Davidović, D. Danković, A. Ilić, I. Manić, S. Golubović, S. Djorić-Veljković, Z. Prijić, A. Prijić, and N. Stojadinović, "Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors", Japanese Journal of Applied Physics, vol. 57, no. 4, article number. 044101-1-10 (2018) ISSN: 0021-4922 DOI: 10.7567/JJAP.57.044101 (M23)
34. N. Stojadinović, S. Djorić-Veljković, V. Davidović, S. Golubović, S. Stankovic, A. Prijić, Z. Prijić, I. Manić, D. Danković, "NBTI and irradiation related degradation mechanisms in power VDMOS transistors", Microelectronics Reliability, vol. 88-90, pp. 135-141 (2018) ISSN: 0026-2714, DOI: 10.1016/j.microrel.2018.07.138 (invited paper) (M22)
35. Dencho Spassov, Albena Paskaleva, Elżbieta Guziewicz, Vojkan Davidović, Srboljub Stanković, Snežana Djorić-Veljković, Tzvetan Ivanov, Todor Stanchev, Ninoslav Stojadinović, "Radiation tolerance and charge trapping enhancement of ALD HfO2/Al2O3 nanolaminated dielectrics", Materials, vol. 14, no. 4, pp. 849 (2021) ISSN: 1996-1944 DOI: 10.3390/ma14040849 (M22)
36. Danijel Danković, Vojkan Davidović, Snežana Golubović, Sandra Veljković, Nikola Mitrović, Snežana Djorić-Veljković, “Radiation and Annealing Related Effects in NBT Stressed P-Channel Power VDMOSFETs”, Microelectronics Reliability, vol. XX, no. XX, pp. XXX-XXX (2021). ISSN: 0026-2714, DOI: 10.1016/j.microrel.2021.114273. accepted for publication (M23)
37. Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Snežana Golubović, Snežana Djorić-Veljković, A. Paskaleva, D. Spassov, S. Stanković, M. Andjelković, Z. Prijić, I. Manić, A. Prijić, G. Ristić, D. Danković, "Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress", Journal of Circuits, Systems and Computers, Open Access2022, Article number 2240003, DOI: 10.1142/S0218126622400035
38. N. Mitrović, S. Veljković, V. Davidović, S. Djorić-Veljković, S. Golubović, E. Živanović, Z. Prijić, D. Danković, "Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications", Microelectronics Reliability, vol. 138, November 2022, Article number 114634, ISSN: 00262714, DOI: 10.1016/j.microrel.2022.114634
1. M. Kocić, S. Djorić, D. Vučić, "Difrakcioni efekti Gauss-ovog snopa svetlosti na dva simetrično postavljena otvora u odnosu na osu snopa", Zbornik radova Tehnološkog fakulteta u Leskovcu, str.133-139, (1992)
2. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović, S. Dimitrijev, “Effects of gate bias stressing in power VDMOSFETs”, Serbian Journal of Electrical Engineering, vol. 1, pp. 89-101 (2003)
3. М. Petrović, S. Đorić-Veljković, J. Karamarković, "Puasonov potok događaja kao model za prolazak vozila kroz presek puta", Zbornik radova Građevinsko-arhitektonskog fakulteta, Niš, str.181-188 (2010)
4. Danijel Danković, Ivica Manić, Vojkan Davidović, Aneta Prijić, Snežana Djorić-Veljković, Snežana Golubović, Zoran Prijić, Ninoslav Stojadinović, "Lifetime Estimation in NBT-Stressed P-Channel Power VDMOSFETs", Facta Universitatis: Series Automatic Control and Robotics, vol. 11, no. 1, pp. 15-23 (2012) ISSN 1820-6417 http://facta.junis.ni.ac.rs/acar/acar201201/acar20120102.html
5. Snežana Đorić-Veljković, Sofija Rančić, Predrag Janković, "Primena optičkih vlakana za uvođenje svetlosti u objekte", Zbornik radova Građevinsko-arhitektonskog fakulteta, no. 28, pp. 185-194 (2013) http://www.gaf.ni.ac.rs/index1.php UDK:666.189.21:666.22:628.9
6. М. Petrović, S. Đorić-Veljković, J. Karamarković, "Zaštita životne sredine u građevinarstvu sa osvrtom na primenu ekoloških i nano materijala", Vojno tehnicki glasnik/Military Technical Courier, vol. 63, no. 2, pp. 179-194, (2015) DOI: 10.5937/vojtehg63-6478, ISSN: 0042-8469, e-ISSN: 2217-4753, www.vtg.mod.gov.rs http://aseestant.ceon.rs/index.php/vtg/login
7. Sofija M. Rančić, Snežana D. Nikolić-Mandić, Aleksandar Lj. Bojić, Snežana M. Đorić-Veljković, Aleksandra R. Zarubica, Predrag Lj.Janković, "Primena reakcionog sistema alizarin-H2O2 u boratnom puferu za spektrofotometrijsko kinetičko određivanje nikla", Advanced technologies, vol. 4, no. 2, pp. 60-64 (2015) doi:10.5937/savteh1502060R UDK 546.742:543.48
8. Ivica Manić, Danijel Danković, Vojkan Davidović, Aneta Prijić, Snežana Djorić-Veljković, Snežana Golubović, Zoran Prijić, Ninoslav Stojadinović, "Effects of Pulsed Negative Bias Temperature Stressing in P-Channel Power VDMOSFETs", Facta Universitatis, Series: Electronics and Energetics, vol. 29, no. 3, pp. 49-60 (2016) DOI: 10.2298/FUEE1601049M ISSN: 0353-3670
9. Natalija Janošević, Snežana Đorić-Veljković, Gordana Topličić-Ćurčić, Jugoslav Karamarković, "Properties of geopolymers", Facta Universitatis, Series: Architecture and Civil Engineering, vol. 16, pp. 045-056 (2018) ISSN: 0354-4605 DOI: 10.2298/FUACE161226004J (M24)
10. V. Davidović, D. Danković, S. Golubović, S. Djorić-Veljković, I. Manić, Z. Prijić, A. Prijić, N. Stojadinović, S. Stanković, "NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs", Facta Universitatis, Series: Electronics and Energetics, vol. 31, no. 3, pp. 367-388 (2018) (invited paper) ISSN: 0353-3670 DOI: 10.2298/FUEE1803367D https://doi.org/10.2298/FUEE1803367D (M24)
11. Adrijana Pavlović, Snežana Đorić-Veljković, Jugoslav Karamarković, "The importance of ethylene-tetrafluoroethylene for building daylighting", Facta Universitatis, Series: Architecture and Civil Engineering, vol. 16, no. 3, pp. 355-374 (2018) ISSN: 0354-4605 DOI: 10.2298/FUACE171129014P (M24)
1. S. Djorić-Veljković and V. Davidović, “Analysis of Gamma-Irradiation Induced Oxide Charge and Interface Trap Effects in Power VDMOSFETs”, Proc. 20th International Conference on Microelectronics (MIEL 1995), vol. 1, Niš, September 1995 (pp. 259-262) ISBN 0-7803-2786-1
2. N. Stojadinović, S. Golubović, V. Davidović, S. Djorić-Veljković and S. Dimitrijev, "Modeling of Radiation-Induced Mobility Degradation in MOSFETs", Proc. 21st International Conference on Microelectronics (MIEL’97), Niš, September 1997 (pp. 355-356) ISBN 0-7803-3664-X
3. V. Davidović, S. Djorić-Veljković, S. Golubović and N. Stojadinović, "Room Temperature Relaxation of Irradiated and Cooled Power VDMOS Transistors", Proc. 6th International Conference on Mixed Design of Integrated Circuits And Systems (MIXDES’99), Krakow (Poland), June 1999 (pp. 291-294)
4. S. Djorić-Veljković, S. Golubović, V. Davidovic, and N. Stojadinović, "Power VDMOS Transistors Response to Lowered Temperature Conditions", Proc. 22nd International Conference on Microelectronics (MIEL 2000), Niš, May 2000 (pp. 383-386)
5. S. Djorić-Veljković, V. Davidović, S. Golubović and N. Stojadinović, "Radiation Effects in Low-Temperature Stressed Power VDMOS Transistors", Proc. 23rd International Semiconductor Conference (CAS’2000), Sinaia (Romania), October 2000 (pp. 337-340)
6. I. Manić, Z. Pavlović, S. Golubović, S. Djorić-Veljković, V. Davidović, and N. Stojadinović, "Effects of -Irradiation on Drain Current and Transconductance in Power VDMOS Transistors", Proc. 8th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES 2001), Zakopane (Poland), June 2001 (pp. 333-338)
7. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović, and S. Golubović, "Effects of Elevated-Temperature Bias stressing on Radiation Response in Power VDMOS Transistors", Proc. 8th International Symposium on the Physical&Failure Analysis of Integrated Circuits (IPFA 2001), Singapore, July 2001 (pp. 243-248)
8. N. Stojadinović, S. Djorić-Veljković, V. Davidović, I. Manić, and S. Golubović, "Gamma-Irradiation Effcets in Power MOSFETs for Applications in Communications Satellites", Proc. 5th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services (TELSIKS 2001), Niš, September 2001 (pp.395-400)
9. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, and S. Dimitrijev, "Mechanisms of Positive Gate Bias Stress Induced Instabilities in Power VDMOSFETs ", Proc. 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2001), Bordeaux (France), October 2001 (pp.1373-1378)
10. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, and S. Dimitrijev, “Effects of Positive Gate Bias Stressing and Subsequent Recovery Treatment in Power VDMOSFETs”, Proc. 4th IEEE International Caracas Conference on Devices, Circuits, and Systems (ICCDCS 2002), Aruba (Dutch Caribbean), 15-17 April 2002, pp. DO50-1 DO50-8 (рад по позиву)
11. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović and S. Dimitrijev, “Spontaneous Recovery of Positive Gate Bias Stressed Power VDMOSFETs”, Proc. 23nd International Conference on Microelectronics (MIEL 2002), Niš, May 2002 (pp. 717-722)
12. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović and S. Golubović, “Effects of Positive Gate Bias Stress on Radiation Response in Power VDMOSFETs”, Proc. 23nd International Conference on Microelectronics (MIEL 2002), Niš, May 2002 (pp. 723-726)
13. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović and S. Golubović, “Radiation Response of Elevated-Temperature Bias Stressed Power VDMOSFETs”, Proc. 6th International Seminar on Power Semiconductors (ISPS 2002), Prague (Czech Republic), September 2002 (pp. 69-74)
14. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović, and S. Dimitrijev, "Mechanisms of Spontaneous Recovery in Positive Gate Bias Stressed Power VDMOSFETs", Proc. 13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2002), Rimini (Italy), October 2002 (pp. 1465-1468)
15. N. Stojadinović , I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović and S. Dimitrijev, “Effects of Negative Gate Bias Stressing in Thick Gate Oxides for Power VDMOSFETs”, Abstract Booklet 12th Workshop on Dielectrics in Microelectronics (WoDiM 2002), Grenoble (France), November 2002 (pp. 41-44)
16. N. Stojadinović, I. Manić, S. Djorić-Veljković, V. Davidović and S. Golubović, “Electrical Stress Effects in Thick Gate Oxides for Power MOS Devices”, 12th International School on Condensed Matter Physics (ISCMP 2002), Varna (Bulgaria), September 2002
17. S. Djorić-Veljković, I. Manić, V. Davidović, S. Golubović and N. Stojadinović, “Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs”, Proc. 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2003), Grenoble (France), October 2003 (pp. 1465-1468)
18. V. Davidović, I. Manić, S. Djorić-Veljković, D. Danković, S. Golubović, S. Dimitrijev and N. Stojadinović, “Effects of Negative Gate Bias Stressing in Power VDMOSFETs”, 7th International Symposium on Microelectronics Technologies and Microsistems (MTM 2003), Sozopol (Bulgaria), September 2003 (pp.150-155)
19. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović and S. Dimitrijev, “Effects of Electrical Stressing in Power VDMOSFETs”, Conference on Electron Devices and Solid-StateCircuits (EDSSC 2003), Hong Kong (China), December 2003 (pp. 291-296)
20. S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, “Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs”, Proc. 24th International Conference on Microelectronics (MIEL 2004), Niš, May 2004 (pp.701-704)
21. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović, S. Dimitrijev, “Electrical stressing effects in power VDMOSFETs”, Proc. 7th International Seminar on Power Semiconductors (ISPS 2004), Prague, September 2004 (pp. 109-114)
22. N. Stojadinović, I. Manić, V. Davidović, D. Danković, S. Djorić-Veljković, S. Golubović and S. Dimitrijev, "Effects of electrical stressing in power VDMOSFETs" - Invited paper, 1st International Conference on Electrical and Electronic Engineering (ICEEE 2004), Acapulco (Mexico), September 2004
23. N. Stojadinović, D. Danković, S. Djorić-Veljković, V. Davidović, I. Manić, S. Golubović, “Negative bias temperature instability mechanisms in p-channel power VDMOSFETs”, Proc. 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2005), Bordeaux (France), October 2005 (pp.1343-1348) also Microelectron. Reliab., vol. 45, (2005)
24. I. Manić, S. Djorić-Veljković, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, “Spontaneous recovery in DC gate bias stressed power VDMOSFETs”, Proc. 25th International Conference on Microelectronics (MIEL 2006), Beograd, May 2006 (pp.639-644)
25. D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, N. Stojadinović, “Lifetime estimation in NBT stressed p-channel power VDMOSFETs”, Proc. 25th International Conference on Microelectronics (MIEL 2006), Beograd, May 2006 (pp.645-648)
26. V. Davidović, N. Stojadinović, D. Danković, S. Golubović, I. Manić, S. Djorić-Veljković, S. Dimitrijev, “Turn-around of threshold voltage in gate bias stressed p-channel power VDMOS transistors”, Proc. 9th International Seminar on Power Semiconductors (ISPS 2006), Prague, September 2006 (pp.85-89)
27. D. Danković, I. Manić, S. Djorić-Veljković, V. Davidović, S. Golubović, N. Stojadinović, “NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs”, Proc. 17h European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2006), Vupertal (Germany), October 2006 (pp. 1828-1833)
28. N. Stojadinović, D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, and S. Golubović, "Impact of Negative Bias Temperature Instabilities on Lifetime in p-Channel Power MOSFETs", Proc. 8th International Conference on Telecommunications in Modern Satellite, Cable and Broadcasting Services (TELSIKS 2007), Niš (Serbia), September 2007 (pp. 275-282) ISBN 1-4244-1467-9 (IEEE), 978-86-85195-54-9 (ivited paper) (FEE)
29. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, N. Stojadinović, "Negative Bias Temperature Instabilities in Sequentialy Stressed and Annealed in p-Channel Power VDMOSFETs", Proc. 18h European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2007), Bordeaux (France), October 2007 (pp. 1410-1415)
30. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, and N. Stojadinović, "New Approach in Estimating the Lifetime in NBT Stressed p-Channel Power VDMOSFETs", Proc. 26th International Conference on Microelectronics (MIEL‘08), Niš, May 2008 (pp.599-602) ISBN 978-1-4244-1881-7
31. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, and N. Stojadinović, "Negative Bias Temperature Sress and Annealing Effects in p-Channel Power VDMOSFETs", Proc. 9th International Seminar on Power Semiconductors (ISPS‘08), Prague, August 2008 (pp.127-133) , ISBN 978-80-01-04139-0
32. D. Danković, I. Manić, V. Davidović, S. Djorić-Veljković, S. Golubović, and N. Stojadinović, "Negative Bias Temperature Instability in n-Channel Power VDMOSFETs", Proc. 19th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF’08), Maastricht (Netherlands), September 2008 (pp. 1313 - 1317) also Microelectronics Reliability 2008
33. I. Manić, D. Danković, S. Djorić-Veljković, V. Davidović, S. Golubović, and N. Stojadinović, "Effects of Low Gate Bias Annealing in NBT Stressed p-Channel Power VDMOSFETs", Proc. 20th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF’09), Bordeaux, October 2009 (pp. 1003 - 1007)
34. S. Djorić-Veljković, D. Danković, A. Prijić, I. Manić, V. Davidović, S. Golubović, Z. Prijić and N. Stojadinović, "Degradation of p-channel Power VDMOSFETs under Pulsed NBT Stress", Proc. 27th International Conference on Microelectronics (MIEL 2010), Niš, May 2010 (pp. 443-446)
35. I. Manić, D. Danković, S. Djorić-Veljković, A. Prijić, V. Davidović, S. Golubović, Z. Prijić, and N. Stojadinović, “Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress”, Proc. 10th International. Seminar on Power Semiconductors (ISPS 2010), Prague (Czech Republic) September 2010 (pp. 173-178)
36. N. Stojadinović, D. Danković, I. Manić, A. Prijić, V. Davidović, S. Djorić-Veljković, S. Golubović, Z. Prijić, “Threshold Voltage Instabilities in p-Channel Power VDMOSFETs Under Pulsed NBT Stress”, Proc. 21st European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2010), Gaeta (Italy) October 2010, pp. 1278-1282
37. S. Đorić-Veljković, J. Karamarković, "Challanges and Possibilities of Application of OLED Light Sources", Proc. Innovation as a Function of Engineering Development (IDE 2011), Niš, 25 -26 November 2011, pp. 103-108 publisher: Faculty of Civil engineering and Architecture ISBN 978-86-80295-98-5, COBISS.SR – ID 187462412
38. Snežana Đorić-Veljković, Sofija Rančić, Predrag Janković, Bojan Rančić, Using Novel Systems and Installations for Introducing Daylight, Proc. of 9th Scientific Technical Conference Contemporary theory and Practice in Building Development, Banja Luka, 11. -12. April, 2013, (pp. 405-413) ISBN: 978-99955-630-8-0
39. S. Rančić, S. Djorić-Veljković, A. Zarubica, "Environmently friendly colors", Proc. of 2013 - “Color in all directions”, Third International Color Conference for the Southeast European countries, Veliko Tarnovo, Bulgaria, 18. -20. June, 2013, pp. 496-501 ISSN 1313-4884
40. D. Randjelovic, M. Vasov, J. Karamarkovic, S. Djoric-Veljkovic, H. Krstic, "The influence of interior colors for efficient energy consumption", Proc. of 2013 - “Color in all directions”, Third International Color Conference for the Southeast European countries, Veliko Tarnovo, Bulgaria, 18. -20. June, 2013, pp. 557-567 ISSN 1313-4884
41. S. Djorić-Veljković, J. Karamarković, D. Randjelović, M. Vasov, H. Krstic, "Room surfaces colours and interior lightening", Proc. of 2013 - “Color in all directions”, Third International Color Conference for the Southeast European countries, Veliko Tarnovo, Bulgaria, 18. -20. June, 2013, pp. 577-589 ISSN 1313-4884
42. S. Djorić-Veljković, V. Davidović, D. Danković, I. Manić, S. Golubović, and N. Stojadinović, "Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors", Proc. 29th International Conference on Microelectronics (MIEL‘14), Belgrade, May 2014 (pp. 293-296) DOI: 10.1109/MIEL.2014.6842146
43. A. Jovanovic, S. Djorić-Veljković, J. Karamarkovic, P. Pejic, "Towards determining daylighting conditions in student dormitories-a South Eastern Europe Case Study", Proc. of World Sustainable Buildings Conference Barselona, Barcelona, 28-30 October 2014, Session 136, p. 84, WSB 14,. ISBN: 978-84-697-1815-5
44. M. Stojanovic Krasić, A. Mančić, S. Kuzmanović, S. Đorić Veljković and M. Stepić, “Light propagation through the composite linear photonic lattice containing two nonlinear defects” 5th International School Conference on Photonics (Photonica 2015), Belgrade (Serbia), 24.–28. Avgust 2015 (p. 170) ISBN: 978-86-7306-131-3
45. D. Danković, I. Manić, N. Stojadinović, Z. Prijić, S. Djorić-Veljković, V. Davidović, A. Prijić, A. Paskaleva, D. Spassov, and S. Golubović, "Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs", Proc. 30th International Conference on Microelectronics (MIEL‘17), Niš, October 9-11, 2017 (pp. 147-151) DOI: 10.0.4.85/MIEL.2017.8190089, ISBN: 978-1-5386-2563-7 http://ieeexplore.ieee.org/document/8190089/ (M33)
46. V. Davidović, A. Paskaleva, D. Spassov, E. Guziewicz, T. Krajewski, S. Golubović, S. Djorić-Veljković, I. Manić, D. Danković, and N. Stojadinović, "Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks", Proc. 30th International Conference on Microelectronics (MIEL‘17), Niš, October 9-11, 2017 (pp. 143-146) DOI: 10.1109/MIEL.2017.8190088, ISBN: 978-1-5386-2563-7 http://ieeexplore.ieee.org/document/8190088/ (M33)
47. Gordana Topličić-Ćurčić, Aleksandar Keković, Dušan Grdić, Snežana Đorić - Veljković, Zoran Grdić, "Phase change materials (PCMs) – Innovative materials for improvement of energy effienciency of buildings", 6 th International conference "Contemporary achievements in civil engineering" 20. April 2018. Subotica, SERBIA, Conference Proceedings of 6 th International conference "Contemporary achievements in civil engineering", Faculty of civil engineering Subotica, Subotica 2018, publisher: Faculty of civil engineering Subotica, University of Novi Sad, UDK: 66.018.4:697, DOI:10.14415/konferencijaGFS2018.032, pp. 323 – 334, ISBN: 978-86-80297-73-6 (M33)
48. N. Stojadinović, S. Djorić-Veljković, V. Davidović, S. Golubović, S. Stankovic, A. Prijić, Z. Prijić, I. Manić, D. Danković, "NBTI and irradiation related degradation mechanisms in power VDMOS transistors", 29th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF), Aalborg, Denmark, October 01-05, 2018 (pp. 135-141) DOI: 10.1016/j.microrel.2018.07.138 (invited paper) (M31)
49. Spassov, A. Paskaleva, V. Davidović, S. Djorić-Veljković, S. Stanković, N. Stojadinović, Tz. Ivanov, and T. Stanchev, "Impact of g Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks", Proc. 31th International Conference on Microelectronics (MIEL‘19), Niš, September 16-18, 2019 (pp. 59-62) DOI: 10.1109/MIEL.2019.8889600, ISBN: 978-172813419-2 (M33)
50.Danijel Danković, Nikola Mitrović, Sandra Veljković, Vojkan Davidović, Snežana Djorić Veljković, Zoran Prijić, Albena Paskaleva, Dencho Spassov, Snežana Golubović, “A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETs”, Proc. 32nd International Conference on Microelectronics (MIEL 2021), Niš, Serbia, 12-14 September 2021, pp. 55-62, (invited paper), ISBN: 978-166544528-3, DOI: 10.1109/MIEL52794.2021.9569030, https://ieeexplore.ieee.org/document/9569030 (М31)
51. Sandra Veljković, Nikola Mitrović, Snežana Djorić Veljković, Vojkan Davidović, Ivica Manić, Snežana Golubović, Albena Paskaleva, Dencho Spassov, Zoran Prijić, Aneta Prijić, Srboljub Stanković, Danijel Danković, “Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors” Proc. 32nd International Conference on Microelectronics (MIEL 2021), Niš, Serbia, 12-14 September 2021, pp. 345-350, ISBN: 978-166544528-3, DOI: 10.1109/MIEL52794.2021.9569154, https://ieeexplore.ieee.org/document/9569154 (М33)
52. Danijel Danković, Vojkan Davidović, Snežana Golubović, Sandra Veljković, Nikola Mitrović, Snežana Djorić-Veljković, “Radiation and Annealing Related Effects in NBT Stressed P-Channel Power VDMOSFETs”, Proc 32nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Bordeaux, France, 4-7 October, 2021, pp XX-XX. (М33)
53. Marija Stojanović-Krasić, Slavica Jovanović, Snežana Đorić-Veljković, “Numerical Simulations of Trapping Efficiency in One-dimensional Lattice with a Coupling Defect as a Function of Lattice” Proc. 32nd International Conference on Microelectronics (MIEL 2021), Niš, Serbia, 12-14 September 2021, pp. 81-84, ISBN: 978-166544528-3, DOI: 10.1109/MIEL52794.2021.9569158, https://ieeexplore.ieee.org/document/9569158, (М33)
Marija Stojanović-Krasić, Slavica Jovanović, Snežana Đorić-Veljković, "Trapping efficiency in one-dimensional lattice with a coupling defect as a function of light waveguide", Book of abstracts 14th symposium, "Novel technologies and economic development", Leskovac, 22-23 October 2021 (p. 103) ISBN 978-86-89429-44-2 http://www.tf.ni.ac.rs/novosti/1029-14th-symposium (M34)
Snežana Đorić-Veljković, Predrag Janković, Sofija Rancić, Momčilo Kocić, Marija Stojanović-Krasić, Sandra Veljković, Gordana Topličić-Ćurčić, "Application of novel materials for daylight introduction", Book of abstracts 14th symposium, "Novel technologies and economic development", Leskovac, 22-23 October 2021 (p. 104) ISBN 978-86-89429-44-2 http://www.tf.ni.ac.rs/novosti/1029-14th-symposium (M34)
Nikola Mitrović, Sandra Veljković, Snežana Đorić-Veljković, Vojkan Davidović, Snežana Golubović, Danijel Danković, Zoran Prijić “Methods for modeling of NBTS induced threshold voltage shift in p-channel power VDMOSFETs”, Advanced Ceramics and Applications IX, Belgrade, Serbia, 20-21. September 2021, p 53, ISBN 978-86-915627-8-6, http://www.serbianceramicsociety.rs/doc/aca01-10/aca9/ACA-IX-2021-Book-of-Abstracts.pdf (M34)
Sandra Veljković, Nikola Mitrović, Snežana Đorić-Veljković, Vojkan Davidović, Ivica Manić, Snežana Golubović, Danijel Danković, “Gate oxide degradation of electronic components due to irradiation and bias temperature stress”, Advanced Ceramics and Applications IX, Belgrade, Serbia, 20-21. September 2021, p 62, ISBN 978-86-915627-8-6, http://www.serbianceramicsociety.rs/doc/aca01-10/aca9/ACA-IX-2021-Book-of-Abstracts.pdf М34
N. Mitrović, S. Veljković, V. Davidović, S. Djorić-Veljković, S. Golubović, E. Živanović, Z. Prijić, D. Danković, "Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications", vol. 138, November 2022, Proc 33th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2022) 2022 Conference, Article number 114634, ISSN: 00262714, DOI: 10.1016/j.microrel.2022.114634, also Microelectronics Reliability (М33)
Jelena Stevanović, Miomir Vasov, Snežana Đorić Veljković, Jelena Bijeljić, Marko Ignjatović, Jugoslav Karamarković , "Evaluation of Thermal Comfort Based on the Relation Between Thermal Comfort Metrics and Satisfaction Survey of Occupants", Proc. of 20th International Conference on Thermal Science and Engineering of Serbia (SIMTERM), 18-21 October 2022. pp. , ISBN: http://simterm.masfak.ni.ac.rs/index.php https://www.drustvo-termicara.com/vesti/20th-international-conference-simterm (М33)
Zoran Bonić, Elefterija Zlatanović, Nemanja Marinković, Snežana Đorić-Veljković, Dragan Đorđević, Nikola Romić, Branimir Stanković, "Geotechnical conditions in experimental testing of clayey soil subjected to chemical−electrokinetic treatment", Proceedings of the International Conference "Synergy of Architecture & Civil Engineering (SINARG 2023)", (organisers: Faculty of Civil Engineering and Architecture of University of Niš, Serbian Academy of Sciences and Arts), September 14-15, 2023, Niš, Serbia, vol. 1, pp. 34-42, ISBN: 978-86-88601-80-1; 978-86-88601-82-5 (FOR PUBLISHING ISSUE), https://enauka.gov.rs/handle/123456789/785442, https://project.gaf.ni.ac.rs/sinarg/sites/default/files/2023-09/SINARG23_proceedings_volume_1_print%20final.pdf (М33)
Sandra Veljković, Nikola Mitrović Snežana Djorić-Veljković, Vojkan Davidović, Ivica Manić, Emilija Živanović, Srboljub Stanković, Marko Andjelković, Goran Ristić, Albena Paskaleva, Dencho Spassov, Danijel Danković, "Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation,” Proc. IEEE 33rd International Conference on Microelectronics (MIEL 2023), Niš, Serbia, 16-18 October 2023, pp. 277-280. https://miel.elfak.ni.ac.rs/ (М33)
Snežana Đorić-Veljković, Zoran Bonić, Elefterija Zlatanović, Nemanja Marinković, Marija Stojanović-Krasić, Nikola Romić, Dragan Đorđević, "Approach to some aspects of electrokinetic soil treatment", Book of abstracts 15th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2023 (p. 119) ISBN 978-86-89429-56-5 https://www.tf.ni.ac.rs/symposium/wp-content/uploads/2023/10/ZBORNIK-IZVODA-RADOVA-15-1.pdf (M34)
Miloš Milenković, Nenad Milojević, Marija Stojanović-Krasić, Slavica Jovanović, Dragana Todorović, Snežana Đorić-Veljković, "Heat Convections in Different Shape Containers and Mpemba Effect", Book of abstracts 15th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2023 (p. 140) ISBN 978-86-89429-56-5 https://www.tf.ni.ac.rs/symposium/wp-content/uploads/2023/10/ZBORNIK-IZVODA-RADOVA-15-1.pdf (M34)
Marija Stojanović-Krasić, Slavica Jovanović, Dragana Todorović, Sandra Veljković, Snežana Đorić-Veljković, "Compact Modes in Two-Dimensional Photonic Lattices", Book of abstracts 15th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2023 (p. 141) ISBN 978-86-89429-56-5 https://www.tf.ni.ac.rs/symposium/wp-content/uploads/2023/10/ZBORNIK-IZVODA-RADOVA-15-1.pdf (M34)
Sandra Veljković, Nikola Mitrović, Snežana Đorić-Veljković, Dragan Vučković, Jelena Stevanović, Predrag Janković, Danijel Danković, " Analysis of the Light Emission Processes in OLED Devices Materials", Book of abstracts 15th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2023 (p. 112) ISBN 978-86-89429-56-5 https://www.tf.ni.ac.rs/symposium/wp-content/uploads/2023/10/ZBORNIK-IZVODA-RADOVA-15-1.pdf (M34)
Predrag Janković, Snežana Đorić-Veljković, Jelena Stevanović, Sandra Veljković, Miomir Vasov, "Water Jet Cutting as an Ecological and Highly Verastile Technolohy", Book of abstracts 15th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2023 (p. 118) ISBN 978-86-89429-56-5 https://www.tf.ni.ac.rs/symposium/wp-content/uploads/2023/10/ZBORNIK-IZVODA-RADOVA-15-1.pdf (M34)
Nikola Mitrović, Sandra Veljković, Vojkan Davidović, Snežana Đorić-Veljković, Snežana Golubović, Emilija Živanović, Zoran Prijić, Danijel Danković, “Threshold voltage shift in irradiated and pulsed NBT stressed p-channel VDMOS transistors”, Elicsir Project Symposium, Nis (Serbia), 25-27 January 2023 (p. 44) http://www.symp.elicsir-project.eu/book_of_abstracts.php (M34)
Sandra Veljković, Nikola Mitrović, Vojkan Davidović, Snežana Đorić-Veljković, Snežana Golubović, Emilija Živanović, Zoran Prijić, Danijel Danković, “Experimental setup and procedure for NBT stress and irradiation of VDMOS transistors”, Elicsir Project Symposium, Nis, Serbia, 25-27 January 2023, p. 50, http://www.symp.elicsir-project.eu/book_of_abstracts.php (M34)
1. S. Golubović, G. Ristić. S. Djorić i N. Stojadinović, "Efekti gama-zračenja kod VDMOS tranzistora snage", Zbornik radova I Srpske konferencije o mikro i optoelektronici (MIOPEL 92), Beograd, 1992 (str. 1-3)
2. N. Stojadinović, S. Djorić, S. Golubović and S. Dimitrijev, "Analysis of Gamma-Irradiation Induced Degradation Mechanisms in Power MOSFETs: Changes in Gate Oxide Charge and Interface Traps", Proc. 2nd Serbian Conference on Microelectronics and Optoelectronics (MIOPEL 93), Niš, October 1993 (pp. 67-72)
3. S. Dimitrijev, S. Djorić, S. Golubović and N. Stojadinović, "Analysis of Gamma-Irradiation Induced Degradation Mechanisms in Power MOSFETs: Creation of Gate Oxide Charge and Interface Traps", Proc. 2nd Serbian Conference on Microelectronics and Optoelectronics (MIOPEL 93), Niš, October 1993 (pp. 73-79) (nagrađen rad)
4. S. Djorić-Veljković i V. Davidović, “Analiza efekata gama zračenjem indukovanih naelektrisanja u oksidu i površinskih stanja kod VDMOS tranzistora snage”, Zbornik radova XXXIX jugoslovenske konferencije za ETRAN, Zlatibor, jun 1995 (str. 139-142)
5. S. Djorić, M. Kocić, D. Vučić, “Fraunhoferova difrakcija svetlosti na pukotini koja je pokrivena sa dva fazna sloja”, Zbornik radova I simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1995 (str. 11-16)
6. D. Vučić, M. Kocić, D. Stojiljković, S Djorić, S. Žerajić, “Mojre metoda izračunavanja elastične deformacije savijanja kružne ploče”, Zbornik radova I simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1995 (str. 69-73)
7. S. Djorić-Veljković, Z. Veljković, M. Kocić, D. Vučić, “Pitanje odlaganja i mogućnosti uništavanja radioaktivnog otpada”, Zbornik radova II simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1996 (str. 60-63)
8. M. Kocić, S. Djorić-Veljković, Z. Veljković, S. Stojiljković i D. Stojiljković, “Neki aspekti tehnologije optičkih vlakana“, Zbornik radova II simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1996 (str. 58-59)
9. S. Djorić-Veljković, M. Kocić, D. Stojiljković i D. Vućić, “Neka pitanja razvoja tehnologije optićkih vlakana i optićkih kablova”, Zbornik izvoda radova III simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1998 (str. 47)
10. M. Kocić, S. Djorić-Veljković i D. Stojiljković, “Elementi slabljenja talasa u optićkim vlaknima”, Zbornik izvoda radova III simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1998 (str. 48)
11. D. Vućić, M. Kocić i S. Djorić-Veljković, “Standardizacija nivoa bezbednosti u sistemu radijacione zaštite”, Zbornik izvoda radova III simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 1998 (str. 46)
12. D. Stojiljković, M. Kocić and S. Djorić-Veljković, “Application of the system of differential equations to modelling the breaking of the yarns”, XIII Conference on Applied Mathematics PRIM’98 Abstracts, Igalo, May 1998 (p. 42)
13. S. Djorić-Veljković, S. Golubović, V. Davidović i N. Stojadinović, “Uticaj različitih naprezanja na formiranje latentnih defekata tokom spontanog oporavka VDMOS tranzistora snage”, Zbornik radova XLIII jugoslovenske konferencije za ETRAN, Zlatibor, septembar 1999, sveska IV, (str. 139-141)
14. S. Djorić-Veljković, S. Golubović, V. Davidović and N. Stojadinović, “Efekti niskih temperatura kod VDMOS tranzistora snage”, Zbornik radova XLIV jugoslovenske konferencije za ETRAN, Soko Banja, jun 2000, sveska IV, (str. 185-188)
15. S. Djorić-Veljković, M. Kocić, D. Stojiljković i N. Cakić, “Elementi razvoja tehnologije optićkih vlakana i optićkih kablova”, Zbornik izvoda radova IV simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 2001 (str. 151)
16. S. Djorić-Veljković, N. Stojadinović, I. Manić, V. Davidović, S. Golubović, “Uticaj temperaturno- naponskih testova pouzdanosti na efekte zračenja kod VDMOS tranzistora snage”, Zbornik radova XLV jugoslovenske konferencije za ETRAN, Bukovička Banja, jun 2001, sveska IV, (str. 200-203)
17. N. Stojadinović, I. Manić, S. Golubović, V. Davidović, S. Djorić-Veljković, S. Dimitrijev, “Efekti naprezanja pozitivnom polarizacijom na gejtu kod VDMOS tranzistora snage”, Zbornik radova XLV jugoslovenske konferencije za ETRAN, Bukovička Banja, jun 2001, sveska IV, (str. 204-207)
18. N. Stojadinović, S. Djorić-Veljković, I. Manić, V. Davidović, S. Golubović, “Uticaj električnog naprezanja na otpornost VDMOS tranzistora snage na zračenje”, Zbornik radova XLVI jugoslovenske konferencije za ETRAN, Banja Vrućica (Republika Srpska), jun 2002, sveska IV, (str. 142-144)
19. V. Davidović, S. Golubović, I. Manić, D. Danković, N. Stojadinović, S. Djorić-Veljković, S. Dimitrijev, “Primena tehnika za razdvajanje efekata naelektrisanja u oksidu i površinskih stanja kod VDMOS tranzistora snage”, Zbornik radova XLVI jugoslovenske konferencije za ETRAN, Banja Vrućica (Republika Srpska), jun 2002, sveska IV, (str. 145-148)
20. I. Manić, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, S. Djorić-Veljković, S. Dimitrijev, “Efekti naprezanja negativnom polarizacijom na gejtu kod VDMOS tranzistora snage”, Zbornik radova XLVII jugoslovenske konferencije za ETRAN, Herceg Novi, jun 2003, sveska IV, (str. 183-186)
21. S. Djorić-Veljković, N. Stojadinović, I. Manić, V. Davidović, S. Golubović, “Uticaj temperaturno-naponskih testova pouzdanosti na efekte odžarivanja kod ozračenih VDMOS tranzistora snage”, Zbornik radova XLVII jugoslovenske konferencije za ETRAN, Herceg Novi, jun 2003, sveska IV, (str. 187-190)
22. M. Kocić, D. Vućić i S. Djorić-Veljković, “Primena Freinelovih integrala kod rešenja problema difrakcije svetlosti konstantne amplitude na uskom prorezu”, Zbornik izvoda radova V simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 2003 (str. 124-125)
23. M. Kocić, S. Djorić-Veljković i D. Vućić, “Neke karakteristike slabljenja talasa u svetlovodima”, Zbornik izvoda radova V simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 2003 (str. 126)
24. V. Davidović, N. Stojadinović, D. Danković, S. Golubović, I. Manić, S. Djorić-Veljković, S. Dimitrijev, “Turn-around efekat napona praga kod PMOS tranzistora naprezanih pozitivnim naponima na gejtu”, Zbornik radova XLIX jugoslovenske konferencije za ETRAN, Budva, jun 2005, sveska IV, (str. 125-128)
25. D. Danković, I. Manić, V. Davidović, S. Golubović, N. Stojadinović, S. Djorić-Veljković, “Nestabilnosti p-kanalnog VDMOS tranzistora snage usled naponsko-temperaturnih naprezanja sa negativnom polarizacijom gejta”, Zbornik radova XLIX jugoslovenske konferencije za ETRAN, Budva, jun 2005, sveska IV, (str. 129-132)
26. S. Djorić-Veljković i M. Kocić, “Neki aspekti slabljenja talasa u svetlovodima”, Zbornik izvoda radova VI simpozijuma “Savremene tehnologije i privredni razvoj”, Leskovac, oktobar 2005 (s. 146)
27. S. Djorić-Veljković i M. Kocić, "Neki elementi tehnologije optičkih vlakana", Zbornik izvoda radova VII simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, oktobar 2007 (s. 157)
28. D. Danković, I. Manić, V. Davidović, S. Golubović, N. Stojadinović, S. Djorić-Veljković, "Life Time Evaluation in p-channel Power VDMOSFETs Under NBT Stress", Zbornik radova LII konferencije za ETRAN, Palić, 08-12 jun 2008., str. MO1.2-1-4.
29. S. Djorić-Veljković, V. Davidović, S. Golubović, "Efekti NBT naprezanja i odžarivanja kod P-kanalnog VDMOS tranzistora snage", Zbornik radova LII konferencije za ETRAN, Palić, 08-12 jun 2008., str. MO1.3-1-4.
30. D. Danković, I. Manić, V. Davidović, S. Golubović, N. Stojadinović, S. Djorić-Veljković, "Instabilities in p-channel power VDMOSFETs Subjected to Multiple Negative Bias Temperature Stressing and Annealing", Zbornik radova LIII konferencije za ETRAN, Vrnjačka Banja, 08-12 jun 2009., str. MO1.1-1-4.
31. Đ. Kostadinović, D. Danković, I. Manić, V. Davidović, S. Golubović, N. Stojadinović, S. Djorić-Veljković, Efekti spontanog oporavka kod p-kanalnih VDMOS tranzistora snage naprezanih jakim električnim poljem u oksidu gejta", Zbornik radova LIII konferencije za ETRAN, Vrnjačka Banja, 15-18 jun 2009., str. MO1.2-1-4.
32. S. Djorić-Veljković i M. Kocić, "Elementi slabljenja talasa u svetlovodima", Zbornik izvoda radova VIII simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, oktobar 2009 (s. 169)
33. D. Danković, A. Prijić, I. Manić, V. Davidović, S. Golubović, N. Stojadinović, Z, Prijić, S. Djorić-Veljković, Instabilities in p-Channel Power VDMOSFETs Subjected to Pulsed Negative Bias Temperature Stressing”, Zbornik radova LIV konferencije za ETRAN, Donji Milanovac, 7-10. jun 2010, str. MO1.1-1-4.
34. Snežana Đorić-Veljković, “Priroda i svojstva elektromagnetnog zračenja i termografija”, Zbornik radova I Naučno-stručnog simpozijuma Instalacije & Arhitektura I&A, Beograd, 28-29. oktobar 2010, str. 273-282.
35. М. Petrović, S. Đorić-Veljković, J. Karamarković, "Puasonov potok događaja kao model za prolazak vozila kroz presek puta", Saopšten na Konferenciji Sinergija Arhitekture i građevinarstva, Novembar 2010, Niš, Takođe, Zbornik radova Građevinsko-arhitektonskog fakulteta, Niš, str.181-188 (2010)
36. S. Zdravković, S. Djorić-Veljković i M. Kocić, "Interakcija jonizujućeg zračenja sa materijom", Zbornik izvoda radova IX simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 21-22 oktobar 2011 (s. 157) ISBN 978-86-82367-92-5 (M64) Издавач: Технолошки факултет у Лесковцу
37. D. Danković, A. Prijić, I. Manić, V. Davidović, S. Golubović, Z. Prijić, N. Stojadinović, S. Đorić-Veljković, "Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima", Zbornik radova LVI konferencije za ETRAN, Zlatibor, 11-14 Jun 2012, str. MO1.1-1- MO1.1-4.
38. S. Djorić-Veljković, S. Rančić, "Innovative Systems and Installation for Providing of Light Into the Buildings", Zbornik radova III Naučno-stručnog simpozijuma Instalacije & Arhitektura I&A, Beograd, 8. novembar 2012, str. 183-189. ISBN 978-86-7924-086-6 Izdavač: Arhitektonski Fakultet Univerzitet u Beogradu
39. S. Djorić-Veljković, I. Manić, V. Davidović, D. Danković, S. Golubović, N. Stojadinović, “Uticaj odžarivanja na oporavak električno naprezanih VDMOS tranzistora snage”, Zbornik radova LVII konferencije za ETRAN, Zlatibor, 3-6. jun 2013 (str. MO1.2-1-6) (nagrađen rad)
40. S. Rančić, S. Đorić-Veljković, P. Janković, "Primena polimetilmetakrilata u proizvodnji optičkih vlakana za specifične namene", Zbornik izvoda radova X simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 22-23 oktobar 2013 (s. 128) ISBN 978-86-82367-98-7
41. S. Đorić-Veljković, M. Kocić, D. Ranđelović, Lj. Antić, "Optička vlakna kao medijum za prenošenje dnevne svetlostI", Zbornik izvoda radova X simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 22-23 oktobar 2013 (s. 160) ISBN 978-86-82367-98-7
42. S. Rančić, S. Nikolić-Mandić, A. Bojić S. Đorić-Veljković, "Određivanje Co(II) u rastvoru", Zbornik izvoda radova X simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 22-23 oktobar 2013 (s. 175) ISBN 978-86-82367-98-7
43. S. Đorić-Veljković, S. Rančić, P. Janković, M. Kocić, Marija Stojanović-Krasić, Lj. Antić, "Transmission of the visible region of electromagnetic radiation spectrum through optical fibers", Zbornik izvoda radova XI simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 23-24 oktobar 2015 (s. 156) ISBN 978-86-89429-12-1
44. S. Rančić, S. Nikolić-Mandić, A. Bojić S. Đorić-Veljković, A. Zarubica, P. Janković,"Određivanje Ni(II) u rastvoru", Zbornik izvoda radova XI simpozijuma "Savremene tehnologije i privredni razvoj", Leskovac, 23-24 oktobar 2015 (s. 157) ISBN 978-86-89429-12-1 (M64)
45. Vojkan Davidović, Albena Paskaleva, Dencho Spassov, Ezbieta Guziewicz, Tomasz Krajewski, Snežana Golubović, Snežana Đorić-Veljković, Ivica Manić, Danijel Danković, Ninoslav Stojadinović, "Ispitivanje višeslojnih HfO2/Al2O3 struktura za memorijske komponente", Zbornik 61. Konferencije za elektroniku, telekomunikacije, računarstvo, automatiku i nuklearnu tehniku, ETRAN 2017, MO1.1.1-MO1.1.4, Kladovo, 05.-08. jun 2017. https://www.etran.rs/common/pages/proceedings/ETRAN2017/MO/IcETRAN2017_paper_MO1_1.pdf ISBN 978-86-7466-692-0 (nagrađen rad) (M63)
46. Vojkan Davidović, Danijel Danković, Snežana Golubović, Snežana Đorić-Veljković, Ivica Manić, Zoran Prijić, Aneta Prijić, Ninoslav Stojadinović, “Elektrohemijski procesi kod p-kanalnih VDMOS tranzistora snage pri sukcesivnom NBT naprezanju i ozračivanju”, Zbornik radova 62. konferencije za ETRAN, Palić, 11-14 jun 2018, str. 299-303. https://etran.rs/common/Zbornik%20ETRAN%20IC%20ETRAN-18-final.pdf (M63)
47. Predrag Janković, Snežana Đorić-Veljković, Sofija Rančić, "Problem of water quality in water jet cutting machines", Book of abstracts 12th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2017 (s. 133) ISBN 978-86-89429-22-0 http://www.univerziteti.rs/xi-simpozijum-savremene-tehnologije-i-privredni-razvoj/ (M64)
48. Gordana Topličić-Ćurčić, Snežana Đorić-Veljković, Jugoslav Karamarković, "Phase change materials in green building", Book of abstracts 12th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2017 (s. 150) ISBN 978-86-89429-22-0 http://www.univerziteti.rs/xi-simpozijum-savremene-tehnologije-i-privredni-razvoj/ (M64)
49. Marija Stojanović-Krasić, Slavica Jovanović, Ana Mančić, Snežana Đorić-Veljković, "Light propagation through the system of two nonlinear one-dimensional structuraly different photonic lattices", Book of abstracts 12th symposium, "Novel technologies and economic development", Leskovac, 20-21 October 2017 (s. 171) ISBN 978-86-89429-22-0 http://www.univerziteti.rs/xi-simpozijum-savremene-tehnologije-i-privredni-razvoj/ (M64)
50. Snežana Đorić-Veljković, Vojkan Davidović, Danijel Danković, Snežana Golubović and Ninoslav Stojadinović, "Procedure merenja električnih karakteristika naprezanih p-kanalnih VDMOS tranzistora snage", Zbornik radova LXIII konferencije za ETRAN, Srebrno jezero, 03-06 jun 2019, str. 601-604. ISBN978-86-7466-785-9 https://etran.rs/2019/Proceedings_IcETRAN_ETRAN_2019.pdf (M63)
51. Snežana Đorić-Veljković, Predrag Janković, Sofija Rančić, Momčilo Kocić, Marija Stojanović-Krasić, "Novel Materials for Optical Fibers", Book of abstracts 13th symposium, "Novel technologies and economic development", Leskovac, 18-19 Octoberr 2019 (s. 135) ISBN 978-86-89429-35-0 http://www.tf.ni.ac.rs/index.php?option=com_content&view=article&id=113 (M64)