Naučne publikacije akademskog osoblja

Ukoliko želite, kartone naučnog osoblja ovog fakulteta možete da pogledate i na sajtu Elektronskog fakulteta.

NAPOMENA

Za tačnost unetih podataka o publikacijama, naučnim i umetničkim referencama odgovorni su autori.
Datum kreiranja: 14.09.2015.

Milić Pejović

Dodatne informacije

  • Lični podaci

  • Datum rođenja: 23.10.1973
  • Mesto rođenja: Niš
  • Obrazovanje

  • Fakultet: Elektronski
  • Odsek / Grupa / Smer: Mikroelektronika i mikrosistemi
  • Godina diplomiranja: 1999
  • Spisak publikacija

  • Monografije i poglavlja u monografijama:

    1. Momčilo M. Pejović i Milić M. Pejović, „ELEKTRIČNI PROBOJ GASOVA – Merni sistemi i eksperimentalna istraživanja“, Izdavač Elektronski fakultet, Univerziteta u Nišu, pp. 1-239, 2009, ISBN 978-86-6125-002-6.

    2. Momčilo Pejović, Predrag Osmokrović, Milić Pejović and Koviljka Stanković, „Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors“, Chapter in book  „Current Topics in Ionizing Radiation Research“, Edited by Mitsuru Nenoi, Publishe by InTech, pp. 761-816, 2012, ISBN 978-953-307-51-0196-3.

    3. Momčilo M. Pejović and Milić M. Pejović (Editors),  „DFFERENT TYPES OF FIELD EFFECT TRANSISTORS- theory and application”, Published by InTeach, 2017, Printed ISBN 978-953-51-3175-5, Online ISBN 978-953-51-3176-2.

    4. Momčilo M. Pejović and Milić M. Pejović, „Application of pMOS dosimeters in radiotherapy”, Chapter in book “Radiotherapy”, Edited by Cem Onal, Publishe by InTech, pp. 231-250, 2017, printed ISBN 978-953-51-3149-6, Online ISBN 978-953-51-3150-2.

    5. Milić M. Pejović, Koviljka Stanković, Momčilo Pejović and Predrag Osmokrović, “Processes induced by electrical breakdown responsible for the memory effect in low pressure noble gases”, Chapter in book “Advances in chemistry research, Vol. 47, Edited by J. C. Taylor, Published by Nova science Publishers, Inc., New York, pp. 47-93, 2019, ISSN: 1940-0950, ISBN: 978-1-53614-716-2.

    6. Milić M. Pejović, Momčilo M. Pejović, „PRIMENA PMOS TRANZISTORA U DOZIMETRIJI JONIZUJUĆEG ZRAČENJA“, Izdavač SVEN, Niš, pp. 1-189, 2020, ISBN 978-86-7746-818-7.

  • Knjige i udžbenici:

    1. Momčilo M. Pejović i Milić M. Pejović,  Fizičke veličine i merne jedinice. Merna nesigurnost, Izdavač Elektronski fakultet Univerziteta u Nišu, pp. 1-135, 2012, ISBN 978-86-6125-060-6.

    2. Milić Pejović, Momćilo Pejovič, Predrag Osmokrović, JONIZUJUĆE ZRAČENJE-izvori i merenje, Izdavač Akademska misao, Beograd, pp. 1-311, 2017, ISBN 978-86-7466-647-0.

  • Radovi u časopisima sa IMPACT faktorom:

    1. Momčilo M. Pejović, Goran S. Ristić, Čedomir S. Milosavljević and Milić M. Pejović, „ Influence of tube wall material type and tube temperature on the recombination processes of nitrogen ions and atoms in afterglow“, Journal of Physics D: Applied Physics, Institute of Physics Publishing, Vol. 35, pp. 2536-2542, 2002, ISSN 0022-3727, M21, http://iopscience.iop.org/0022-3727/35/20/312/ .

    2. Milić M. Pejović, Čedomir S. Milosavljević and Momčilo M. Pejović, „Electrical                            system for measurement of breakdown voltage of vacuum and gas-filled tubes using a dynamic method“, Review of Scientific Instruments, American Institute of Physics, Vol. 74, No. 6, pp. 3127-3129, 2003, ISSN 0034-6748, M21, http://scitation.aip.org/content/aip/journal/rsi/74/6/10.1063/1.1571972 .

    3. Momčilo M. Pejović,  Čedomir S. Milosavljević and Milić M. Pejović, „The estimation of static breakdown voltage for gas-filled tubes at low pressures using dynamic method“, IEEE Transaction on Plasma Science, Institute of Electrical and Electronics Engineers, Inc., Vol. 31, No. 4, pp. 776-781, 2003, ISSN 0093-3813, M23, http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1221868 .

    4. Momčilo M. Pejović, Emilija N. Živanović and Milić M. Pejović, „Kinetics of ions and neutral active states in afterglow and their influence on the memory effect in nitrogen at low pressures“, Journal of Physics D: Applied Physics, Institute of Physics Publishing, Vol. 37, pp. 200-210, 2003, ISSN 0022-3727, M21, http://iopscience.iop.org/0022-3727/37/2/008/ .

    5. Milić M. Pejović, „Digital system for vacuum and gas-filled devices testing“, Review of Scientific Instruments, American Institute of Physics, Vol. 76, No. 1,  224501 (5pp), 2005, ISSN 0034-6748, M21, http://scitation.aip.org/content/aip/journal/rsi/76/1/10.1063/1.1831252 .

    6. Momčilo M. Pejović and Milić M. Pejović, „The influence of some species formed during the discharge and gamma and UV radiation on breakdown voltage and time delay in nitrogen and neon at low pressure“, Plasma Sources Science and Technology, Institute of Physics Publishing, Vol. 14, pp. 492-500, 2005, ISSN 0963-0252, M21, http://iopscience.iop.org/0963-0252/14/3/011/ .

    7. Milić M. Pejović, Momčilo M. Pejović and Goran S. Ristić, „Gamma and UV radiation effects on breakdown voltage of neon-filled tube“, IEEE Transaction on Plasma Science, Institute of Electrical and Electronics Engineers, Inc., Vol. 33, No. 3, pp. 1047-1052, 2005, ISSN 0093-3813, M23, http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=1440541 .

    8. Momčilo M. Pejović, Nikola T. Nešić and Milić M. Pejović, „Analysis of low-pressure dc breakdown in nitrogen between two spherical iron electrodes“, Physics of Plasmas, American Institute of Physics, Vol. 13, 022108 (8pp), 2006, ISSN 1070-664X, M21, http://scitation.aip.org/content/aip/journal/pop/13/2/10.1063/1.2168162 .

    9. Milić M. Pejović and Momčilo M. Pejović, Investigations of breakdown voltage and time delay of gas-filled surge arresters“, Journal of Physics D: Applied Physics, Institute of Physics Publishing, Vol. 39, pp. 4417-4422, 2006, ISSN 0022-3727, M21, http://iopscience.iop.org/0022-3727/39/20/018/ .

    10. Momčilo M. Pejović, Jugoslav P. Karamarković, Goran S. Ristić and Milić M. Pejović, „Analysis of neutral active particle loss in afterglow in kripton at 2.6 mbar pressure“, Physics of Plasmas, American Institute of Physics, Vol. 15, 013502 (7pp), 2008, ISSN 1070-664X, M21, http://scitation.aip.org/content/aip/journal/pop/15/1/10.1063/1.2817064 .

    11.  Momcilo M. Pejović and Milić M. Pejović, „Memory effect in argon in the presence of vacuum and gas-electrical breakdown mechanism“, Applied Physics Letters, American Institute of Physics, Vol. 92, 011507 (2pp) 2008, ISSN 0003-6951, M21, http://scitation.aip.org/content/aip/journal/apl/92/1/10.1063/1.2831908 .

    12. Momčilo M. Pejović and Milić M. Pejović, „Contribution of statistical time delay and formative time to total breakdown time delay in argon for different afterglow periods“, Journal of Vacuum Science and Technology A, American Institute of Physics, Vol. 26, No. 5, pp. 1326-1330, 2008, ISSN 0734-2101, M22, http://scitation.aip.org/content/avs/journal/jvsta/26/5/10.1116/1.2966435 .

    13. S. Jha, E. V. Jelenković, Milić M. Pejović, G. S. Ristić, M. Pejović, K.Y. Tong, C. Surya, I. Bello and W.J. Zhang, „Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays“, Microelectronic Engineering, Elsevier BV, Vol. 86, pp. 37-40, 2009, ISSN 0167-9317, M21, http://www.sciencedirect.com/science/article/pii/S0167931708003705 .

    14. Momčilo M. Pejović, Emilija N. Živanović, Milić M. Pejović and Jugoslav P. Karamarković, „Analysis of processes responsible for the memory effect in air at low pressure“, Plasma Sources Science and Technology, Institute of Physics Publishing, Vol. 19, 045021 (9pp), 2010, ISSN 0963-0252, M21, http://iopscience.iop.org/0963-0252/19/4/045021/ .

    15. Milić M. Pejović, Dragan B. Denić, Momčilo M. Pejović, Nikola T. Nešić and Nikola Vasović, „Microcontroller based system for electrical breakdown time delay measurement in gas-filled devices“, Review of Scientific Instruments, American Institute of Physics, Vol. 81, 0105104 (6pp), 2010, ISSN 0034-6748, M21, http://scitation.aip.org/content/aip/journal/rsi/81/10/10.1063/1.3491737 .

    16. E.V. Jelenković, G.S. Ristić, Milić M. Pejović, M.M. Jevtić, S.K. Jha, M. Videnović-Mišić, M.M. Pejović and K.Y. Tong, „Effect of fluorination and hydrogenation by ion implatation on reliability of poly-Si TFTs under gamma irradiation“, Journal of Physics D: Applied Physics, Institute of Physics Publishing, Vol. 44,  015101 (7pp), 2011, ISSN 0022-3727, M21, http://iopscience.iop.org/0022-3727/44/1/015101/ .

    17. Nikola T. Nešić, Momčilo M. Pejović, Milić M. Pejović and Emilija N. Živanović, „The influence of additional electron on memory effect in nitrogen at low pressures“, Journal of Physics D: Applied Physics, Institute of Physics Publishing, Vol. 44, 095203 (9pp), 2011, ISSN 0022-3727, M21, http://iopscience.iop.org/0022-3727/44/9/095203/ .

    18. Milić M. Pejović, Momčilo M. Pejović and Aleksandar B. Jakšić, „Radiation-sensitive field effect transistors response to gamma-ray irradiation“, Nuclear Technology and Radiation Protection, Institut za Nuklearne nauke „Vinča“,  Vol. 25, No. 1, pp. 25-31, 2011, ISSN 1451-3994, M22, http://www.doiserbia.nb.rs/Article.aspx?ID=1451-39941101025P .

    19. Emilija N. Živanović, Momčilo M. Pejović, Milić M. Pejović and Nikola T. Nešić, „Analysis of statistical nature of electrical breakdown time delay in nitrogen at 6.6 mbar pressure in presence of positive ions and N(4S) atoms“, Contributions to Plasma Physics, John Wiley & Sons, Inc., Vol. 51, No. 9, pp. 877-884, 2011, ISSN 0863-1042, M23, http://onlinelibrary.wiley.com/doi/10.1002/ctpp.201000117/abstract;jsessionid=6193D1A7AF4CE47AADFE66809405C552.f02t01 .

    20.  Milić M. Pejović, Momčilo M. Pejović and Koviljka Stanković, „Experimental investigation of breakdown voltage and electrical breakdown time dalay of commercial gas discharge tubes“, Japanese Journal of Applied Physics, Institute of Pure and Applied Physics, Vol. 50, 086001 (5pp), 2011, ISSN 0021-4922, M23, http://jjap.jsap.jp/link?JJAP/50/086001/ .

    21.  Milić M. Pejović, Momčilo  M. Pejović and Aleksandar B. Jakšić, „ Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature“, Sensors and Actuators A: Physical, Elsevier S. A., Vol. 174,  pp. 85-90, 2012, ISSN 0924-4247, M21, http://www.sciencedirect.com/science/article/pii/S0924424711007096 .

    22.  Momčilo M. Pejović, Emilija N. Živanović, Milić M. Pejovic, Nikola T. Nešić and Dragan Kovačević, „Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism“, VACUUM, Pergamon, Vol. 86, pp. 1860-1866, 2012, ISSN 0042-207X, M23, http://www.sciencedirect.com/science/article/pii/S0042207X1200245X .

    23. Momčilo M. Pejović, Nikola T. Nešić, Milić M. Pejović and Emilija N. Živanović, „Afterglow processes responsible for memory effect in nitrogen“, Journal of Applied Physics, American Institute of Physics, Vol. 112, 013301 (10pp), 2012, ISSN 0021-8979, M21, http://scitation.aip.org/content/aip/journal/jap/112/1/10.1063/1.4730622 .

    24. Momčilo M. Pejović, Nikola T. Nešić, Milić M. Pejovic, Dragan V. Brajović and Ivana V. Spasić, „Investigation of post-discharge processes in nitrogen at low pressure“, Physics of Plasmas, American Institute of Physics, Vol. 19, 123512 (8pp), 2012, ISSN 1070-664X, M21, http://scitation.aip.org/content/aip/journal/pop/19/12/10.1063/1.4773026 .

    25. Milić M. Pejović, Momčilo M. Pejović, Aleksandar B. Jakšić, Koviljka Stanković and Slavoljub M. Marković, „Successive gamma-ray irradiation and corresponding post-irradiation annealing of pMOS dosimeters“, Nuclear Technology and Radiation Protection, Institut za Nuklearne nauke „Vinča“, Vol. 27, No. 4, pp. 341-345, 2012 ISSN 1451-3994, M22, http://www.doiserbia.nb.rs/Article.aspx?ID=1451-39941204341P .

    26. Milić M. Pejović, Momčilo M. Pejović and Aleksandar B. Jakšić, „Response of pMOS dosimeters on gamma-ray irradiation during its re-use“, Radiation Protection Dosimetry, Oxfor University Press, Vol. 155, No. 4, pp. 394-403, 2013, ISSN 0144-8420, M22, http://rpd.oxfordjournals.org/content/155/4/394 .

    27. Momčilo M. Pejović, Ivana V. Spasić, Milić M. Pejović, Nikola T. Nešić and Dragan V. Brajović, „Proccesses in afterglow responsible for initiation of electrical breakdown in xenon at low pressure“, Journal of Plasma Physics, Cambridge University Press, Vol. 79, part 5, pp. 641-646, 2013, ISSN 0022-3778, M23, http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=9009933 .

    28. Milić Pejović, Olivera Ciraj-Bjelac, Milojko Kovačević, Zoran Rajović and Gvozden Ilić, „Sensitivity of p-channel MOSFET to x- and gamma-ray irradiation“, International Journal of Photoenergy, Hindawi Publishing Corporation, Vol. 2013, 158403 (6pp), 2013, ISSN 1110-662X, M21, http://www.hindawi.com/journals/ijp/2013/158403/ .

    29. Irfan Fetahović, Milić Pejović and Miloš Vujisić, „Radiation damage in electronic memory devices“, International Journal of Photoenergy, Hindawi Publishing Corporation, Vol. 2013, 170269 (5pp), 2013, ISSN 1110-662X, M21, http://www.hindawi.com/journals/ijp/2013/170269/ .

    30. Bojan Cavrić, Edin Dolićanin, Predrag Petronijević, Milić Pejović and Koviljka Stanković, „Radiation hardness of flash memory fabricated in deep-submicron technology“, International Journal of Photoenergy, Hindawi Publishing Corporation, Vol. 2013, 158792 (7pp), 2013, ISSN 1110-662X, M21, http://www.hindawi.com/journals/ijp/2013/158792/ .

    31. Srđan Milosavljević, Đorđe Lazarević, Koviljka Stanković, Milić Pejović and Miloš Vujisić, „Effects of ion beam irradiation on nanoscale InOx cooper-pair insulattors“, International Journal of Photoenergy, Hindawi Publishing Corporation, Vol. 2013, 236823 (8pp), 2013, ISSN 1110-662X, M21, http://www.hindawi.com/journals/ijp/2013/236823/ .

    32. Milić M. Pejović „Gamma-ray irradiation sensitivity and dosimetric information instability of RADFETs“, Nuclear Technology and Radiation Protection, Institut za Nuklearne nauke „Vinča“, Vol. 28, No. 4, pp. 415-421, 2013, ISSN 1451-3994, M22, http://www.doiserbia.nb.rs/Article.aspx?id=1451-39941304415P#.U60j30CwbnQ .

    33. Milić M. Pejović, Nikola T. Nešić and Momčilo M. Pejović, „Electrical breakdown time delay in nitrogen-filled tube with small inter electrode gap“, IEEE Transaction Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers, Inc., Vol. 21, No. 2, pp. 612-616, 2014, ISSN 1070-9878, M22, http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6783053&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F94%2F6783027%2F06783053.pdf%3Farnumber%3D6783053.

    34. Milić M. Pejović, Nikola T. Nešić and Momčilo M. Pejović, „Kinetics of positive ions and electrically neutral active particles in afterglow in neon at low pressure“, Physics of Plasmas, American Institute of Physics, Vol. 21, 042111(8 pp), 2014, ISSN 1070-664X, M21, http://scitation.aip.org/content/aip/journal/pop/21/4/10.1063/1.4871485.

    35. Milić M. Pejović, "The Application of a Small-Volume Neon-Filled Tube in Overvoltage Protection", IEEE Trans. Plasma Sci., Institute of Electrical and Electronics Engineers, Inc., Vol. 43, no. 4, pp. 1063-1067, 2015, ISSN: 0093-3813, M23, http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7050316

    36. Milić M. Pejović, "Dose response, radiation sensitivity and signal fading of p-channel MOSFETs (RADFETs) irradiated up to 50 Gy with 60Co", Applied Radiation and isotopes, Pergamon, Vol. 104, pp. 100-105, 2015, ISSN:0969-8043, M21, http://www.sciencedirect.com/science/article/pii/S0969804315300695

    37. Milić M. Pejović, "Application of p-channel power VDMOSFET as a high radiation doses sensor", IEEE Trans. Nucl. Sci., Institute of Electrical and Electronics Engineers, Inc., Vol. 62, no. 4, pp.1905-1910, 2015, ISSN: 0018-9499, M21, http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=7180410&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F23%2F4689328%2F07180410.pdf%3Farnumber%3D7180410

    38. Milić M. Pejović, Dose response, radiation sensitivity and fading of p-channel MOSFETs (RADFETs) irradiated up to 50 Gy with Co“, Applied Radiation and Isotpoes, Vol. 104, pp. 100-105, 2015,ISSN: 0969-8043, http://dx.doi.org/10.1016/j.apradiso. 2015.06.024, M22.

    39. Milić M. Pejović, „Processes in radiation sensitive MOSFETs during irradiation and post irradiation annealing responsible for threshold voltage shift”, Radiation Physics and Chemistry, Vol. 130, pp. 221-228, 2017, ISSN: 0969-806X, http://dx.doi.org/10.1016/j.radphyschem 2016.08.027, M21.

    40. Milić M. Pejović, Koviljka Stanković, Irfan Fetahović and Momčilo Pejović, „Processes in insulating gas induced by electrical breakdown responsible for commercial gas-filled surge arresters delay response“, Vacuum, Vol. 137, pp. 85-91, 2017, ISSN: 0042-207X, http://dx.doi.org/10.1016/J. vacuum  2016.12.030, M22.

    41. Luka Perazić, Koviljka Stanković, Čedomir Belić and Milić Pejović, “Influence of the percentage share of electronegative gas in the mixture with noble gas on the free-electron gas spectrum and recovery time”, IEEE Transaction on Dielectrics and Electrical Insulation, Vol. 24, No. 5, pp. 2765-2773, 2017, ISSN: 1070-9878, DOI:10.1109/TDEI.2017.006426, M22.

    42. Marija  D. Obrenović, Milić M. Pejović, Djordje R. Lazarević and Nenad M. Kartalović, The effects induced by the gamma-ray responsible for the threshold voltage shift of commercial p-channel power VDMOSFET, Nuclear technology and Radiation Protection, Vol. 33, No. 1, pp. 81-86, 2018, ISSN: 1451-3994, http://doi.org/10.2298/NTRP 1801081O, M23.

    43. Milić M. Pejović and Svetlana M. Pejović, “VDMOSFET as a prospective dosimeter for radiotherapy”, Applied Radiation and Isotopes, Vol. 132, pp. 1-5, 2018, ISSN: 0969-8043, http://dx.doi.org/10.1016/j.apradiso 2017.11001, M22.

    44. Milić M. Pejović, Momčilo M. Pejović and Koviljka Stanković, „Physico-Chemical processes induced by electrical breakdown and discharge responsible for memory effect in krypton with <10 ppm nitrogen”, Plasma Chemistry and Plasma Processing, Vol. 38, No. 2, pp. 415-428, 2018, ISSN: 0272-4324, Https://doi.org/10.10007/s11090-017-9870-2, M21.

    45. Dalibor Arbutina, Koviljka Stanković, Luka Perayić and Milić Pejović, „Influence of the shape, number, position and dimensions  of conductive particles within inter-electrode gap on dc and puls breakdown voltage value of SF and N mixture“, Electrical Power and Energy Systems, Vol. 104, pp. 436-442, 2019, ISSN: 0142-0615, https://doi.org./10.1016/j.ijepes.2018.07.041, M21.

    46. Svetlana M. Pejović, Milić M. Pejović, Miloš Živanović, „Small dose effect in RADFET with thick gate oxide“, Applied Radiation and Isotopes, Vol. 152, pp. 72-77, 2019, ISSN: 0969-8043, https://doi.org/10.1016/j.apradiso.2019.06.034, M22.

    47. Čedomir I. Belić, Koviljka Đ. Stanković, Milić M. Pejović and Predrag V. Osmokrović, “The influence of the magnetic field on DC and the impulse breakdown of noble gases”, Materials, Vol. 12, pp. 752, 2019, ISSN: 1996-1944, https://doi.org/10.3390/ma12050752, M21.

    48. Milić M. Pejović, “Deffects induced by gamma-ray irradiation and post-irradiation annealing and its influence on the threshold voltage of p-channel power VDMOS transistors”, Radiation Effects and Defects in Solids, Vol. 174, Issue 7/8, pp. 567-578, 2019, ISSN: 1042-0150, https://doi.org/10.1080/10420150.2019.1619735, M23.

    49. Milić Pejović, Emilija Živanović and Miloš Živanović, “Investigation of xenon-filled tube breakdown voltage and delay response as possible dosimetric parameters for small air kerma rates”, Radiation Protection Dosimetry, Vol. 190, No. 1, pp. 84-89, 2020, ISSN: 0144-8420, DOI:10.1093/rpd/ncaa075, M23.

  • Radovi u ostalim časopisima:

    1. Milić M. Pejović, „Physico-chemical processes in vertical-double-diffused metal-oxide-semiconductor field effect transistors induced by gamma-ray irradiation and post-irradiation annealing“, Facta Universitatis, series: Physics, Chemistry and Technology, Vol. 13, No. 1, pp. 13-27, 2015, DOI: 10.2298/FUCT1501013p, UDC621.039:541.15.


    2. Milić M. Pejović, “P-channel MOSFET as a sensor and dosimeter of ionizing radiation”, Facta Universitatis, Series: Electronics and Energetics, Vol. 29, No. 4, pp. 509-541, 2016 (pregledni rad), DOI:10.2298/FUEE 1604509P.

  • Radovi na naučnim skupovima međunarodnog značaja:

    1. Milić M. Pejović, Čedomir S. Milosavljević and Momčilo M. Pejović, „Automatsko merenje i akvizicija podataka probojnog napona gasnih i vakuumskih cevi“, HIPNEF, pp. 263-267, 2002 (Naučno-stručni skup sa međunarodnim učešćem). ISBN 978-86-80587-87-5 (MF), M33.

    2. Milić M. Pejović, Čedomir S. Milosavljević and Momčilo M. Pejović, „System for measurement of breakdown voltage for gas-filled tube“, Proc. 21st Summer School and Int. Symp. on the Physics of Inized Gases, 21st. SPIG, Contributed papers, Ed M.K. Radović and M.S. Jovanović, Faculty of Sciences and Mathematics, University of Niš, pp. 398-401, 2002, ISSN 1042-0711, M33.

    3. Emilija N.  Vukosavljević, Milić M. Pejović, and Momčilo M. Pejović, „Memory effect in nitrogen at 4 mbar pressure“, Proc. 21st Summer School and Int. Symp. on the Physics of Inized Gases, 21. SPIG, Contributed papers, Ed M.K. Radović and M.S. Jovanović, Faculty of Sciences and Mathematics, University of Niš, pp. 402-405, 2002, ISSN 1042-0711, M33.

    4. Čedomir Milosavljević, Darko Mitić, Boban Veselić and Milić Pejović, „Digital sliding mode control of X-ray apparatus electrical drives“, 12th. Int. Symp. on Power Electronics-EE 2003, Novi Sad, pp. 1-5, 2003, M33.

    5. Čedomir Milosavljević, Milić Pejović and Goran Milosavljević, „Sliding mode control of third-order objects with stable finite zero“, ICEST, Sofia, pp. 365-368, 2003, ISSN 1755-0556, M33.

    6. Milić M. Pejović, Momčilo M. Pejović and Goran S. Ristić, „A Breakdown voltage measurement on neon-filled tube using digital system“, Proc. 22. Summer School and Int. Symp. on the Physics of Inized Gases, 22th. SPIG, Contributed papers, Ed Lj. Hadžievski, Institute of Physics, Belgrade, pp. 409-412, 2004, ISSN 1042-0711, M33.

    7. Milić M. Pejović, „Digital system for vacuum and gas-filled device testing“, SAUM-04, Beograd, pp. 198-201, 2004, ISBN 978-86-6125-020-0, M33.

    8. J. Kovac jr., S. K. Jha, E. V. Jelenković, O. Kutsay, M. Pejović, C. Suraya, J. A. Zapien, I. Bello, R. Srnanek, J. Kovac and S. Flickyngerova, „Study of temperature distribution in the channels of AlGaN-GsN HEMT devices by m-Raman characterisation technique“, Advanced Semiconductor Devices and Microsystems (ASDAM), 8th International Conference, 25-27. Oct. 2010, pp. 123-126, 2010, ISBN 978-1-4244-8574-1, M33.

    9. Milić Pejović, Momčilo Pejović, Nikola Nešić, Nataša Bogdanović i Zijad Bajramović, „The evolution of time delay and electrical breakdown measurement system“, Chapter in book Application of innovative techniques in engineering, Thematic Proceedings, University of Niš, Faculty of Civil Engineering and Architecture, Niš, pp.145-164, 2011, ISSN:978-86-80295-97-8, M24.

    10. Milić Pejović, Momčilo Pejović, radeta marić, Ljubinko Timotijević and Koviljka Stanković, „Delay response of gas discharge tubes“, PIERS Proceeding, Malasia, pp. 1156-1159, 2012, ISSN 1559-9450, M33.

    11. Milić M. Pejović, Momčilo M. Pejović and Nikola T. Nešić, „RADFET as a sensor and dosimeter of gamma-ray radiation“, ICEST 2013, Oxrid, pp. 713-716, 2013, ISSN 1755-0556, M33.

    12. Momčilo M. Pejović, Nikola T. Nešić and Milić M. Pejović, „Investigation of memory effect by measurement of time delay of electrical breakdown in commercial gas-filled surge arresters“, ICEST 2013, Oxrid, pp. 367-370, 2013, ISSN 1755-0556, M33.

    13. Milić M. Pejović, S. Djekić, B. Jokanović, I. Fetahović and P. Osmokrović, „Electrical breakdown time delay in commercial gas-filled surge arresters“, Pulsed Power Conference, may 31-june 4, 2015, Austin-Texas, USA, pp. 1-7, 2015.

    14. Koviljka Stanković, Milić Pejović and Predrag Osmokrović, “Effects of ionizing radiation on the physical and fundamental parameters of VDMOS and PMOS components”, Applied Matematic and Materials (MATERIALS’15), Rome, Italy, November 7-9, pp. 109-116, 2015, Published by WSEAS Press, ISSN: 2227-4588, ISBN: 978-1-61804-347-4

    15. E. Živanović, S. Veljković, M. Živković and M. Pejović, “Reliability of various type of gas-filled surge arresters under DC discharge”, Proc. 2019 IEEE 31st International Conference on Microelectronics (MIEL), Serbia, September 16-18, 2019, pp. 113-116.


    16. Miloš Djordjević, Vesna Paunović, Danijel Danković, Milić Pejović, A Method for Automating the Measurement and Characterization of Electrical Materials, 14th International conference on advanced technologies systems and services in telecommunications, TELSIKS 2019, October 23-25, pp. 219-222, Nis, 2019.



Poslednji put izmenjeno četvrtak, 13 maj 2021 11:06